Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11455715 | Epitaxy metrology in fin field effect transistors | Jitendra Pradipkumar Chaudhary, Roman Kris, Ran Alkoken, Sahar LEVIN, Chih-Chieh Chang | 2022-09-27 |
| 11443420 | Generating a metrology recipe usable for examination of a semiconductor specimen | Roman Kris, Grigory Klebanov, Tal Orenstein, Meir Vengrover, Noa Marom +3 more | 2022-09-13 |