Issued Patents 2022
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11460419 | Electron diffraction holography | Yuchen Deng, Holger Kohr | 2022-10-04 |
| 11456149 | Methods and systems for acquiring 3D diffraction data | Bart Buijsse, Yuchen Deng | 2022-09-27 |
| 11450505 | Magnetic field free sample plane for charged particle microscope | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer | 2022-09-20 |
| 11437216 | Reduction of thermal magnetic field noise in TEM corrector systems | Pleun Dona | 2022-09-06 |
| 11404241 | Simultaneous TEM and STEM microscope | Yuchen Deng, Holger Kohr | 2022-08-02 |
| 11239045 | Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems | Marcel Niestadt | 2022-02-01 |