PT

Peter Christiaan Tiemeijer

FE Fei: 1 patents #22 of 105Top 25%
📍 Eindhoven, OR: #1 of 2 inventorsTop 50%
Overall (2022): #301,936 of 548,613Top 60%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11450505 Magnetic field free sample plane for charged particle microscope Alexander Henstra, Ali Mohammadi-Gheidari 2022-09-20