Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450505 | Magnetic field free sample plane for charged particle microscope | Alexander Henstra, Peter Christiaan Tiemeijer | 2022-09-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450505 | Magnetic field free sample plane for charged particle microscope | Alexander Henstra, Peter Christiaan Tiemeijer | 2022-09-20 |