Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507020 | Optical measurement system for obtaining and analyzing surface topography of object | Hsiang-Chun Wei, Chia-Hung Cho, Chun-Wei Lo, Chih-Hsiang Liu | 2022-11-22 |
| 11474144 | Method for inspecting light-emitting diodes and inspection apparatus | Yan-Rung Lin, Chih-Hsiang Liu, Shie-Chang Jeng | 2022-10-18 |