Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507020 | Optical measurement system for obtaining and analyzing surface topography of object | Hsiang-Chun Wei, Chung-Lun Kuo, Chun-Wei Lo, Chih-Hsiang Liu | 2022-11-22 |
| 11248903 | Three-dimension measurement device and operation method thereof | Po-Yi Chang, Yi-Sha Ku, Kai-Ping Chuang, Chih-Hsiang Liu, Fu-Cheng Yang | 2022-02-15 |