Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507020 | Optical measurement system for obtaining and analyzing surface topography of object | Hsiang-Chun Wei, Chung-Lun Kuo, Chia-Hung Cho, Chun-Wei Lo | 2022-11-22 |
| 11474144 | Method for inspecting light-emitting diodes and inspection apparatus | Yan-Rung Lin, Chung-Lun Kuo, Shie-Chang Jeng | 2022-10-18 |
| 11248903 | Three-dimension measurement device and operation method thereof | Chia-Hung Cho, Po-Yi Chang, Yi-Sha Ku, Kai-Ping Chuang, Fu-Cheng Yang | 2022-02-15 |