PP

Pavel Potocek

FE Fei: 4 patents #2 of 105Top 2%
Overall (2022): #28,403 of 548,613Top 6%
5
Patents 2022

Issued Patents 2022

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
11488800 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging Remco Schoenmakers, Maurice Peemen, Bert Henning Freitag 2022-11-01
11482400 Method, device and system for remote deep learning for microscopic image reconstruction and segmentation Remco Schoenmakers, Maurice PEEMAN, Faysal Boughorbel 2022-10-25
11380529 Depth reconstruction for 3D images of samples in a charged particle system Milo{hacek over (s)} Hovorka, Maurice Peemen, Luká{hacek over (s)} Hübner 2022-07-05
11355305 Low keV ion beam image restoration by machine learning for object localization Remco Johannes Petrus Geurts, Maurice Peemen, Ondrej Machek 2022-06-07
11282670 Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images Luká{hacek over (s)} Hübner, Milo{hacek over (s)} Hovorka, Erik René Kieft 2022-03-22