Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380529 | Depth reconstruction for 3D images of samples in a charged particle system | Pavel Potocek, Maurice Peemen, Luká{hacek over (s)} Hübner | 2022-07-05 |
| 11282670 | Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images | Pavel Potocek, Luká{hacek over (s)} Hübner, Erik René Kieft | 2022-03-22 |