Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380529 | Depth reconstruction for 3D images of samples in a charged particle system | Pavel Potocek, Milo{hacek over (s)} Hovorka, Maurice Peemen | 2022-07-05 |
| 11282670 | Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images | Pavel Potocek, Milo{hacek over (s)} Hovorka, Erik René Kieft | 2022-03-22 |
| 11264200 | Lamella alignment based on a reconstructed volume | Tomá{hacek over (s)} Onderli{hacek over (c)}ka, Jaroslav Stárek | 2022-03-01 |