Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430631 | Methods of inspecting samples with multiple beams of charged particles | Xuedong Liu, Wei Fang, Jack Jau | 2022-08-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430631 | Methods of inspecting samples with multiple beams of charged particles | Xuedong Liu, Wei Fang, Jack Jau | 2022-08-30 |