Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10943048 | Defect inspection apparatus and defect inspection method | Kazuhiro Nojima, Atsushi Onishi, Kazuhiro Yamada, Shigeki Nojima, Akira Hamaguchi | 2021-03-09 |
TT
Tomohide Tezuka
Overall (2021): #226,772 of 548,734Top 45%
1
Patents 2021