Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10943048 | Defect inspection apparatus and defect inspection method | Kazuhiro Nojima, Tomohide Tezuka, Atsushi Onishi, Kazuhiro Yamada, Akira Hamaguchi | 2021-03-09 |
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Shigeki Nojima
Overall (2021): #261,398 of 548,734Top 50%
1
Patents 2021