Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10943048 | Defect inspection apparatus and defect inspection method | Kazuhiro Nojima, Tomohide Tezuka, Atsushi Onishi, Kazuhiro Yamada, Shigeki Nojima | 2021-03-09 |
AH
Akira Hamaguchi
Overall (2021): #542,461 of 548,734Top 100%
1
Patents 2021