Issued Patents 2021
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199575 | Prober and probe card precooling method | — | 2021-12-14 |
| 11169206 | Inspection apparatus, inspection system, and aligning method | Masanori Ueda, Kentaro Konishi | 2021-11-09 |
| 11099236 | Inspection device and contact method | Takanori Hyakudomi, Masanori Ueda, Kentaro Konishi | 2021-08-24 |
| 11092641 | Inspection apparatus and inspection method | — | 2021-08-17 |
| 11067624 | Inspection system | Kentaro Konishi, Hiroki Shikagawa | 2021-07-20 |
| 10935570 | Intermediate connection member and inspection apparatus | Hiroaki Sakamoto | 2021-03-02 |
| 10901028 | Substrate inspection method and substrate inspection device | Hiroshi Yamada | 2021-01-26 |