Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199578 | Testing apparatus and testing method | Hung-Chih Lin, Mill-Jer Wang | 2021-12-14 |
| 11018065 | Semiconductor device structure with magnetic element in testing region | Mill-Jer Wang, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2021-05-25 |