Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199576 | Probe head structure of probe card and testing method | Ming-Cheng Hsu | 2021-12-14 |
| 11199578 | Testing apparatus and testing method | Tang-Jung Chiu, Hung-Chih Lin | 2021-12-14 |
| 11029331 | Universal test mechanism for semiconductor device | Chi-Che Wu, Hung-Chih Lin, Hao Chen | 2021-06-08 |
| 11018065 | Semiconductor device structure with magnetic element in testing region | Tang-Jung Chiu, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2021-05-25 |