Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11056365 | Fault detection method in semiconductor fabrication facility | Hom-Chung Lin, Jih-Churng Twu, Chin-Yun Chen, Yu-Chi Tsai | 2021-07-06 |
TL
Tai-Hsiang Lin
Overall (2021): #241,547 of 548,734Top 45%
1
Patents 2021