Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11056365 | Fault detection method in semiconductor fabrication facility | Hom-Chung Lin, Jih-Churng Twu, Tai-Hsiang Lin, Yu-Chi Tsai | 2021-07-06 |
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Chin-Yun Chen
Overall (2021): #503,928 of 548,734Top 95%
1
Patents 2021