Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150080 | Thickness measurement apparatus, thickness measurement method, and thickness measurement program | Hak-Sung Kim, Gyung Hwan OH, Deok Joong Kim | 2021-10-19 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150080 | Thickness measurement apparatus, thickness measurement method, and thickness measurement program | Hak-Sung Kim, Gyung Hwan OH, Deok Joong Kim | 2021-10-19 |