Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150080 | Thickness measurement apparatus, thickness measurement method, and thickness measurement program | Hak-Sung Kim, Deok Joong Kim, Dong Woon PARK | 2021-10-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150080 | Thickness measurement apparatus, thickness measurement method, and thickness measurement program | Hak-Sung Kim, Deok Joong Kim, Dong Woon PARK | 2021-10-19 |