Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11029359 | Failure detection and classsification using sensor data and/or measurement data | Lin Lee Cheong, Lakshmikar Kuravi | 2021-06-08 |
| 11029673 | Generating robust machine learning predictions for semiconductor manufacturing processes | Rohan D. Kekatpure, Jeffrey Drue David | 2021-06-08 |
| 11022642 | Semiconductor yield prediction | Jeffrey Drue David, Lin Lee Cheong | 2021-06-01 |