Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11193895 | Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection device | Kentaro OHIRA, Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka | 2021-12-07 |
| 11107655 | Charged particle beam device | Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi | 2021-08-31 |
| 11059986 | Composition comprising a nanosized light emitting material | Noriyuki MATSUDA | 2021-07-13 |
| 11002687 | Defect inspection method and defect inspection device | Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi, Tomohiko Ogata | 2021-05-11 |
| 10991981 | Nonaqueous electrolyte secondary battery | Yuanlong Zhong | 2021-04-27 |
| 10923315 | Charged particle beam apparatus, and method of adjusting charged particle beam apparatus | Tomohiko Ogata, Noriyuki Kaneoka, Hisaya Murakoshi, Katsunori Onuki | 2021-02-16 |