DW

David M. Williamson

NI Nikon: 3 patents #14 of 257Top 6%
ES Educational Testing Service: 1 patents #8 of 31Top 30%
Overall (2021): #51,405 of 548,734Top 10%
4
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11099483 Euv lithography system for dense line patterning Donis Flagello, Stephen P. Renwick, Daniel Gene Smith, Michael Binnard 2021-08-24
11054745 Illumination system with flat 1D-patterned mask for use in EUV-exposure tool Daniel Gene Smith 2021-07-06
11049409 Systems and methods for treatment of aberrant responses Mo Zhang, Jing Chen, Andre Alexander Rupp 2021-06-29
10890849 EUV lithography system for dense line patterning Donis Flagello, Stephen P. Renwick, Daniel Gene Smith, Michael Binnard 2021-01-12