Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175165 | Acoustic measurement of a fluid flow | Paul Louis Maria Joseph VAN NEER, Uilke Stelwagen, Erwin Johannes Martinus Giling | 2021-11-16 |
| 11035878 | Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system | Laurent Fillinger, Paul Louis Maria Joseph VAN NEER, Marcus Johannes VAN DER LANS, Maarten Hubertus van Es, Hamed Sadeghian Marnani | 2021-06-15 |