Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11010523 | Prediction of test pattern counts for scan configuration determination | Yu Huang, Janusz Rajski, Wu-Tung Cheng | 2021-05-18 |
| 10977400 | Deterministic test pattern generation for designs with timing exceptions | Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Chen Wang, Xijiang Lin +1 more | 2021-04-13 |
| 10955460 | Test scheduling and test access in test compression environment | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer | 2021-03-23 |