Issued Patents 2021
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11150299 | Flexible isometric decompressor architecture for test compression | Yu Huang, Sylwester Milewski, Jerzy Tyszer | 2021-10-19 |
| 11010523 | Prediction of test pattern counts for scan configuration determination | Yu Huang, Mark Kassab, Wu-Tung Cheng | 2021-05-18 |
| 10996273 | Test generation using testability-based guidance | Sylwester Milewski, Yu Huang | 2021-05-04 |
| 10963612 | Scan cell architecture for improving test coverage and reducing test application time | Nilanjan Mukherjee, Jedrzej Solecki | 2021-03-30 |
| 10955460 | Test scheduling and test access in test compression environment | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Jakub Janicki, Jerzy Tyszer | 2021-03-23 |