Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060846 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Houssam Chouaib, Aaron Rosenberg, Kai-Hsiang Lin, Dawei Hu | 2021-07-13 |