Issued Patents 2021
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156661 | Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolution | Szczepan Urban, Jakub Janicki, Manish Sharma, Yu Huang | 2021-10-26 |
| 11106848 | Diagnostic resolution enhancement with reversible scan chains | Szczepan Urban, Jakub Janicki, Manish Sharma, Yu Huang | 2021-08-31 |
| 11092645 | Chain testing and diagnosis using two-dimensional scan architecture | Yu Huang | 2021-08-17 |
| 11073556 | Low pin count reversible scan architecture | Yu Huang | 2021-07-27 |
| 11041906 | Optimized scan chain diagnostic pattern generation for reversible scan architecture | Yu Huang, Szczepan Urban, Manish Sharma | 2021-06-22 |
| 11010523 | Prediction of test pattern counts for scan configuration determination | Yu Huang, Janusz Rajski, Mark Kassab | 2021-05-18 |
| 10977400 | Deterministic test pattern generation for designs with timing exceptions | Kun-Han Tsai, Naixing Wang, Chen Wang, Xijiang Lin, Mark Kassab +1 more | 2021-04-13 |