Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11100628 | Thickness measurement of substrate using color metrology | Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz | 2021-08-24 |
NM
Nojan Motamedi
Overall (2021): #314,330 of 548,734Top 60%
1
Patents 2021