Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11100628 | Thickness measurement of substrate using color metrology | Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek | 2021-08-24 |
MJ
Martin A. Josefowicz
Overall (2021): #349,048 of 548,734Top 65%
1
Patents 2021