Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923317 | Detecting defects in a logic region on a wafer | Paul Russell, Hucheng Lee, Kenong Wu | 2021-02-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923317 | Detecting defects in a logic region on a wafer | Paul Russell, Hucheng Lee, Kenong Wu | 2021-02-16 |