Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Jong-An Kim, Si-hyeon Choi, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
DO
Duck Mahn Oh
Overall (2021): #468,950 of 548,734Top 90%
1
Patents 2021