Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10950325 | Memory built-in self test error correcting code (MBIST ECC) for low voltage memories | Deepak I. Hanagandi, Igor Arsovski, Michael A. Ziegerhofer, Kalpesh R. Lodha | 2021-03-16 |