Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10971243 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan +1 more | 2021-04-06 |
| 10950325 | Memory built-in self test error correcting code (MBIST ECC) for low voltage memories | Deepak I. Hanagandi, Igor Arsovski, Valerie H. Chickanosky, Kalpesh R. Lodha | 2021-03-16 |