Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10950325 | Memory built-in self test error correcting code (MBIST ECC) for low voltage memories | Igor Arsovski, Michael A. Ziegerhofer, Valerie H. Chickanosky, Kalpesh R. Lodha | 2021-03-16 |
DH
Deepak I. Hanagandi
Overall (2021): #476,339 of 548,734Top 90%
1
Patents 2021