Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10998075 | Built-in self-test for bit-write enabled memory arrays | William V. Huott, Daniel Rodko, Matthew Steven Hyde | 2021-05-04 |
| 10971242 | Sequential error capture during memory test | William V. Huott, Daniel Rodko | 2021-04-06 |
| 10890623 | Power saving scannable latch output driver | William V. Huott, Yuen H. Chan, Daniel Rodko | 2021-01-12 |