Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131689 | Low-force wafer test probes | David M. Audette, S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam | 2021-09-28 |
| 11085949 | Probe card assembly | David M. Audette, Dustin M. Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III | 2021-08-10 |
| 11041879 | Fluidized alignment of a semiconductor die to a test probe | Eugene Atwood, David M. Audette | 2021-06-22 |
| 11029334 | Low force wafer test probe | David M. Audette, Dennis R. Conti, Marc D. Knox | 2021-06-08 |
| 11009545 | Integrated circuit tester probe contact liner | Charles L. Arvin, David M. Audette, Dennis R. Conti, Brian M. Erwin | 2021-05-18 |
| 10955439 | Electrochemical cleaning of test probes | Charles L. Arvin, David M. Audette | 2021-03-23 |