Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11029334 | Low force wafer test probe | David M. Audette, Marc D. Knox, Grant Wagner | 2021-06-08 |
| 11009545 | Integrated circuit tester probe contact liner | Charles L. Arvin, David M. Audette, Brian M. Erwin, Grant Wagner | 2021-05-18 |