Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10957608 | Guided scanning electron microscopy metrology based on wafer topography | Arpit Yati, Jagdish Chandra Saraswatula, Andrew Cross | 2021-03-23 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10957608 | Guided scanning electron microscopy metrology based on wafer topography | Arpit Yati, Jagdish Chandra Saraswatula, Andrew Cross | 2021-03-23 |