Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10957608 | Guided scanning electron microscopy metrology based on wafer topography | Arpit Yati, Jagdish Chandra Saraswatula, Andrew Cross | 2021-03-23 |
SA
Shivam Agarwal — 1 Patent in 2021
Overall (2021): #266,071 of 548,734Top 50%
1
Patents 2021