WS

Wei-Jhih Su

CC Chunghwa Precision Test Tech. Co.: 7 patents #1 of 11Top 10%
Overall (2021): #14,548 of 548,734Top 3%
7
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11209461 Probe card device and neck-like probe thereof Wen-Tsung Lee, Hsun-Tai Wei, Kai-Chieh Hsieh 2021-12-28
11204371 Probe card device Wen-Tsung Lee, Hsun-Tai Wei, Kai-Chieh Hsieh 2021-12-21
11175312 Staggered probe card Kai-Chieh Hsieh, Hsiao Kang LI, Ying-Ming Tiao 2021-11-16
11073537 Probe card device Wen-Tsung Lee, Kai-Chieh Hsieh, Chao-Hui Tseng 2021-07-27
11041883 Probe card device and rectangular probe thereof Chih-Peng Hsieh 2021-06-22
11009526 Probe card device and three-dimensional signal transfer structure thereof Wen-Tsung Lee, Kai-Chieh Hsieh 2021-05-18
10901001 Probe card device and probe head Chih-Peng Hsieh 2021-01-26