KH

Kai-Chieh Hsieh

CC Chunghwa Precision Test Tech. Co.: 7 patents #1 of 11Top 10%
Overall (2021): #16,519 of 548,734Top 4%
7
Patents 2021

Issued Patents 2021

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
11209461 Probe card device and neck-like probe thereof Wen-Tsung Lee, Hsun-Tai Wei, Wei-Jhih Su 2021-12-28
11204371 Probe card device Wen-Tsung Lee, Hsun-Tai Wei, Wei-Jhih Su 2021-12-21
11175312 Staggered probe card Hsiao Kang LI, Ying-Ming Tiao, Wei-Jhih Su 2021-11-16
11175313 Thin-film probe card and test module thereof Wen-Tsung Lee, Hsun-Tai Wei, Chao Liu 2021-11-16
11073537 Probe card device Wen-Tsung Lee, Chao-Hui Tseng, Wei-Jhih Su 2021-07-27
11009526 Probe card device and three-dimensional signal transfer structure thereof Wen-Tsung Lee, Wei-Jhih Su 2021-05-18
11009524 High speed probe card device and rectangular probe Wen-Tsung Lee 2021-05-18