HW

Hsun-Tai Wei

CC Chunghwa Precision Test Tech. Co.: 3 patents #4 of 11Top 40%
Overall (2021): #80,636 of 548,734Top 15%
3
Patents 2021

Issued Patents 2021

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11209461 Probe card device and neck-like probe thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2021-12-28
11204371 Probe card device Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2021-12-21
11175313 Thin-film probe card and test module thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Chao Liu 2021-11-16