Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11042096 | Alignment measurement system | Stefan Michiel Witte, Alessandro Antoncecchi, Hao Zhang, Stephen EDWARD, Paulus Clemens Maria PLANKEN +3 more | 2021-06-22 |
| 10948409 | Method and apparatus for calculating electromagnetic scattering properties of finite periodic structures | Petrus Maria Van Den Berg | 2021-03-16 |
| 10942461 | Alignment measurement system | Simon Reinald HUISMAN, Sebastianus Adrianus GOORDEN | 2021-03-09 |