Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852246 | Pattern structure inspection device and inspection method | Jongchan Park, YongKeun Park | 2020-12-01 |
| 10551293 | Apparatus for detecting sample properties using chaotic wave sensor | YongKeun Park, JongHee Yoon, KyeoReh Lee, Nam-Kyun Kim | 2020-02-04 |