Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852246 | Pattern structure inspection device and inspection method | Young Dug Kim, Jongchan Park | 2020-12-01 |
| 10585039 | Optical detection system | Hui Jun Park, Kyeo Reh Lee, Seung Woo Shin | 2020-03-10 |
| 10551293 | Apparatus for detecting sample properties using chaotic wave sensor | JongHee Yoon, KyeoReh Lee, Young Dug Kim, Nam-Kyun Kim | 2020-02-04 |