Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10773458 | Terahertz inspection for additively manufactured materials | Donald D. Palmer, Jr., Nathan R. Smith, Shayne Andrew Dorrell | 2020-09-15 |
| 10613041 | System and method for quantifying x-ray backscatter system performance | Matthew T. Grimshaw, Talion Edwards, Gary E. Georgeson, Daniel J. Wright, James E. Engel +3 more | 2020-04-07 |