| 10831957 |
Simulation scaling with DFT and non-DFT |
Jie Liu, Michael C. Shaughnessy-Culver, Stephen Lee Smith, Yong-Seog Oh, Pratheep Balasingam +1 more |
2020-11-10 |
| 10776560 |
Mapping intermediate material properties to target properties to screen materials |
Stephen Lee Smith, Yong-Seog Oh, Michael C. Shaughnessy-Culver, Jie Liu, Terry Sylvan Kam-Chiu Ma |
2020-09-15 |
| 10776552 |
Nano-wire resistance model |
Ibrahim Avci, Shuqing Li, Philippe Roussel, Ivan Ciofi |
2020-09-15 |
| 10756212 |
FinFET with heterojunction and improved channel control |
Stephen Lee Smith, Qiang Lu |
2020-08-25 |
| 10741538 |
Method and apparatus for floating or applying voltage to a well of an integrated circuit |
Jamil Kawa, James David Sproch, Robert B. Lefferts |
2020-08-11 |
| 10706209 |
Estimation of effective channel length for FinFETs and nano-wires |
Yong-Seog Oh, Stephen Lee Smith, Michael C. Shaughnessy-Culver, Jie Liu |
2020-07-07 |
| 10699914 |
On-chip heating and self-annealing in FinFETs with anti-punch-through implants |
Hiu Yung Wong, Qiang Lu |
2020-06-30 |
| 10685156 |
Multi-scale simulation including first principles band structure extraction |
Jie Liu, Michael C. Shaughnessy-Culver, Stephen Lee Smith, Yong-Seog Oh, Pratheep Balasingam +1 more |
2020-06-16 |
| 10685163 |
Computationally efficient nano-scale conductor resistance model |
Karim El Sayed |
2020-06-16 |
| 10679719 |
Enhancing memory yield and performance through utilizing nanowire self-heating |
Jamil Kawa |
2020-06-09 |
| 10665320 |
Logic timing and reliability repair for nanowire circuits |
Jamil Kawa |
2020-05-26 |
| 10606968 |
Atomic scale grid for modeling semiconductor structures and fabrication processes |
Stephen Lee Smith |
2020-03-31 |
| 10586588 |
Reversing the effects of hot carrier injection and bias threshold instability in SRAMs |
Jamil Kawa, Thu Nguyen |
2020-03-10 |
| 10572615 |
Placement and routing of cells using cell-level layout-dependent stress effects |
— |
2020-02-25 |