| 10878918 |
Method for detecting a thinning of the semiconductor substrate of an integrated circuit from its back face and corresponding integrated circuit |
Christian Rivero |
2020-12-29 |
| 10861802 |
Method for forming at least one electrical discontinuity in an integrated circuit, and corresponding integrated circuit |
Christian Rivero, Guilhem Bouton, Mathieu Lisart |
2020-12-08 |
| 10770547 |
Integrated circuit comprising components, for example NMOS transistors, having active regions with relaxed compressive stresses |
Guilhem Bouton, Christian Rivero |
2020-09-08 |
| 10748726 |
Integrated mechanical device with vertical movement |
Christian Rivero, Antonio Di-Giacomo, Brice Arrazat |
2020-08-18 |
| 10714583 |
MOS transistor with reduced hump effect |
Christian Rivero, Guilhem Bouton, Julien Delalleau |
2020-07-14 |
| 10685912 |
Integrated circuit comprising an antifuse structure and method of realizing |
Christian Rivero |
2020-06-16 |
| 10600737 |
Prevention of premature breakdown of interline porous dielectrics in an integrated circuit |
Christian Rivero, Jean-Philippe Escales |
2020-03-24 |
| 10580498 |
Method for detecting a thinning of the semiconductor substrate of an integrated circuit from its back face and corresponding integrated circuit |
Christian Rivero |
2020-03-03 |