Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10802077 | Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes | Shiv Kumar Vats, Himanshu | 2020-10-13 |
| 10747282 | Test circuit for electronic device permitting interface control between two supply stacks in a production test of the electronic device | Srinivas Dhulipalla, Sandip Atal | 2020-08-18 |
| 10620267 | Circuitry for testing non-maskable voltage monitor for power management block | Srinivas Dhulipalla | 2020-04-14 |
| 10527672 | Voltage regulator bypass circuitry usable during device testing operations | Srinivas Dhulipalla | 2020-01-07 |